H27UBG8T2BTA データシートの表示（PDF） - Hynix Semiconductor

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H27UBG8T2BTA

32Gb(4096M x 8bit) Legacy MLC NAND Flash

Hynix Semiconductor 

Preliminary

H27UBG8T2BTR-BC Series

32Gb(4096M x 8bit) Legacy MLC NAND Flash

1.11. Bad Block Replacement

This device may have the invalid blocks when shipped from factory. An invalid block is one that contains one or

more bad bits. Over the lifetime of the device additional Bad Blocks may develop. In this case, the block has to

be replaced by copying the data to a valid block. These additional Bad Blocks can be identified as attempts to

program or erase them will give errors in the Status Register.

The failure of a page program operation does not affect the data in other pages in the same block. Bad block can

be replaced by re-programming the current data and copying the rest of the replaced block to an available valid

block. Refer to Table 4 and Figure 6 for the recommended procedure to follow if an error occurs during an

operation.

Operation

Erase

Program

Read

Recommanded Procedure

Block Replacement

Block Replacement

ECC

Table 4 : Block failure

Figure 6 : Block replacement

Notes:

1. An error occurs on nth page of the Block A during Program or Erase operation.

2. Data in Block A is copied to same location in Block B which is valid block.

3. Nth page of block A which is in controller buffer memory is copied into nth page of Block B

4. Bad block table should be updated to prevent from erasing or programming Block A.

Rev 0.7 / Jan. 2011

15

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