H27UBG8T2BTA データシートの表示（PDF） - Hynix Semiconductor

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H27UBG8T2BTA

32Gb(4096M x 8bit) Legacy MLC NAND Flash

Hynix Semiconductor 

Preliminary

H27UBG8T2BTR-BC Series

32Gb(4096M x 8bit) Legacy MLC NAND Flash

1.10. Bad Block Management

Devices with Bad Blocks have the same quality level and the same AC and DC characteristics as devices where all

the blocks are valid. A Bad Block does not affect the performance of valid blocks because it is isolated from the

bit line and common source line by a select transistor. The devices are supplied with all the locations inside valid

blocks erased (FFh). The Bad Block Information is written prior to shipping. Any block where the 1st Byte in the

spare area of the First and Last page does not contain FFh is a Bad Block. The Bad Block Information must be

read before any erase is attempted as the Bad Block Information may be erased. For the system to be able to

recognize the Bad Blocks based on the original information it is recommended to create a Bad Block table

following the flowchart shown in Figure 5. The 1st block, which is placed on 00h block address, is guaranteed to

be a valid block at the time of shipment.

Figure 5 : Bad block management flow chart

Notes:

1. Do not try to erase the detected bad blocks, because the bad bock information will be lost.

2. Do not perform program and erase operation in invalid block, it is impossible to guarantee the

Input data and to ensure that the function is normal.

Rev 0.7 / Jan. 2011

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