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10XSD200 データシートの表示(PDF) - Freescale Semiconductor

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10XSD200
Freescale
Freescale Semiconductor Freescale
10XSD200 Datasheet PDF : 60 Pages
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 4. Dynamic Electrical Characteristics (continued)
Unless specified otherwise: 8.0 V VPWR 36 V, 3.0 V VDD 5.5 V, -40 C TA 125 C, GND = 0 V. Typical values are
average values evaluated under nominal conditions TA = 25 °C,VPWR = 28 V & VDD = 5.0 V, unless specified otherwise.
Parameter
Symbol
Min
Typ
Max
Unit
TIMING: SPI PORT, IN[0]/ IN[1] SIGNALS & AUTORETRY
Required Low time allowing delatching or triggering sleep mode (direct inputs)
Watchdog Timeout for entering Fail-safe Mode due to loss of SPI contact(38)
tIN
t WDTO
175
250
217
310
325
ms
400
ms
Auto-Retry Repetition Period (when activated):
ms
Auto_period bits = 00
Auto_period bits = 01
Auto_period bits = 10
Auto_period bits = 11
tAUTO_00
tAUTO_01
tAUTO_10
tAUTO_11
105
52.5
26.2
13.1
150
75
37.5
17.7
195
97.5
47.8
24.4
GND PIN TEMPERATURE SENSING FUNCTION
Thermal Prewarning Detection Threshold(39)
TOTWAR
110
125
140
°C
Temperature Sensing output voltage @ TA = 25 °C (470 < RCSNS < 10 k
TFEED
Gain Temperature Sensing output @ TA = 25 °C (470 < RCSNS < 10 k(39)
DTFEED
Temperature Sensing Error, range [-40 °C, 150 °C], default(39)
TFEED_ERROR
Temperature Sensing Error, [-40 °C, 150 °C] after 1 point calibration @ 25 °C(39) TFEED_ERROR
_CAL
918
10.7
-15
-5.0
1078
11.1
1238
11.5
+15
+5.0
mV
mV/°C
°C
°C
Notes:
38. Only when the WD_dis bit set to logic [0] (default). Watchdog timeout defined from the rising edge on RST to rising edge HS[0,1]
39. Values were obtained after lab characterization
10XSD200
18
Analog Integrated Circuit Device Data
Freescale Semiconductor

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