1400 データシートの表示（PDF） - Linear Technology
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1400 Datasheet PDF : 20 Pages
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LTC1400
DIGITAL I PUTS A D DIGITAL OUTPUTS The ● denotes the specifications which apply over the
full operating temperature range, otherwise specifications are at TA = 25°C unless otherwise noted. (Note 5)
SYMBOL
PARAMETER
CONDITIONS
MIN TYP MAX UNITS
VOL
Low Level Output Voltage
IOZ
Hi-Z Output Leakage DOUT
VCC = 4.75V, IO = 160μA
VCC = 4.75V, IO = 1.6mA
VOUT = 0V to VCC
0.05
V
●
0.10
0.4
V
●
±10
μA
COZ
Hi-Z Output Capacitance DOUT (Note 7)
15
pF
ISOURCE
Output Source Current
VOUT = 0V
–10
mA
W U ISINK
Output Sink Current
VOUT = VCC
10
mA
TI I G CHARACTERISTICS The ● denotes the specifications which apply over the full operating temperature
range, otherwise specifications are at TA = 25°C unless otherwise noted. (Note 5)
SYMBOL PARAMETER
CONDITIONS
MIN TYP MAX UNITS
fSAMPLE(MAX) Maximum Sampling Frequency
(Note 6)
● 400
kHz
tCONV
Conversion Time
fCLK = 6.4MHz
●
2.1
μs
tACQ
Acquisition Time (Unipolar Mode)
(Bipolar Mode VSS = –5V)
(Note 7)
●
230
300
ns
●
200
270
ns
fCLK
CLK Frequency
● 0.1
6.4
MHz
tCLK
CLK Pulse Width
(Notes 7, 12)
● 50
ns
tWK(NAP)
Time to Wake Up from Nap Mode
(Note 7)
350
ns
t1
CLK Pulse Width to Return to Active Mode
● 50
ns
t2
CONV↑ to CLK↑ Setup Time
● 80
ns
t3
CONV↑ After Leading CLK↑
●
0
ns
t4
CONV Pulse Width
(Note 11)
● 50
ns
t5
Time from CLK↑ to Sample Mode
(Note 7)
80
ns
t6
Aperture Delay of Sample-and-Hold
Jitter < 50ps (Note 7) ●
45
65
ns
t7
Minimum Delay Between Conversion (Unipolar Mode)
(Bipolar Mode VSS = –5V)
●
265
385
ns
●
235
355
ns
t8
Delay Time, CLK↑ to DOUT Valid
CLOAD = 20pF
●
40
80
ns
t9
Delay Time, CLK↑ to DOUT Hi-Z
CLOAD = 20pF
●
40
80
ns
t10
Time from Previous Data Remains Valid After CLK↑
CLOAD = 20pF
● 14
25
ns
t11
Minimum Time between Nap/Sleep Request to Wake Up Request (Notes 7, 12)
● 50
ns
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: All voltage values are with respect to GND.
Note 3: When these pin voltages are taken below VSS (ground for unipolar
mode) or above VCC, they will be clamped by internal diodes. This product
can handle input currents greater than 40mA below VSS (ground for
unipolar mode) or above VCC without latch-up.
Note 4: When these pin voltages are taken below VSS (ground for unipolar
mode), they will be clamped by internal diodes. This product can handle
input currents greater than 40mA below VSS (ground for unipolar mode)
without latch-up. These pins are not clamped to VCC.
Note 5: VCC = 5V, fSAMPLE = 400kHz, tr = tf = 5ns unless otherwise
specified.
Note 6: Recommended operating conditions.
Note 7: Guaranteed by design, not subject to test.
Note 8: Linearity, offset and full-scale specifications apply for unipolar and
bipolar modes.
Note 9: Integral nonlinearity is defined as the deviation of a code from a
straight line passing through the actual endpoints of the transfer curve.
The deviation is measured from the center of the quantization band.
Note 10: Bipolar offset is the offset voltage measured from –0.5LSB when
the output code flickers between 0000 0000 0000 and 1111 1111 1111.
Note 11: The rising edge of CONV starts a conversion. If CONV returns
low at a bit decision point during the conversion, it can create small errors.
For best performance ensure that CONV returns low either within 120ns
after conversion starts (i.e., before the first bit decision) or after the 14
clock cycle. (Figure 13 Timing Diagram).
Note 12: If this timing specification is not met, the device may not respond
to a request for a conversion. To recover from this condition a NAP
request is required.
1400fa
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