MC74HC245ADWR2G(2014) データシートの表示（PDF） - ON Semiconductor
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MC74HC245ADWR2G Datasheet PDF : 8 Pages
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MC74HC245A
ORDERING INFORMATION
Device
Package
Shipping†
MC74HC245ADWG
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
NLV74HC245ADWG*
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
MC74HC245ADWR2G
SOIC−20 WIDE
(Pb−Free)
1000 Tape & Reel
NLV74HC245ADWR2G*
SOIC−20 WIDE
(Pb−Free)
1000 Tape & Reel
MC74HC245ADTG
TSSOP−20
(Pb−Free)
75 Units / Rail
NLV74HC245ADTG*
TSSOP−20
(Pb−Free)
75 Units / Rail
MC74HC245ADTR2G
TSSOP−20
(Pb−Free)
2500 Tape & Reel
NLV74HC245ADTR2G*
TSSOP−20
(Pb−Free)
2500 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*NLV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q100 Qualified and PPAP
Capable.
DIRECTION
tr
INPUT
A OR B
tPLH
OUTPUT
B OR A
90%
50%
10%
90%
50%
10%
tTLH
tf
VCC
GND
tPHL
tTHL
Figure 1. Switching Waveform
OUTPUT
ENABLE
A OR B
A OR B
50%
VCC
GND
50%
tPZL tPLZ
50%
tPZH tPHZ
50%
VCC
10%
90%
GND
HIGH
IMPEDANCE
VOL
VOH
HIGH
IMPEDANCE
Figure 2. Switching Waveform
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
DEVICE
UNDER
TEST
TEST POINT
OUTPUT 1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 3. Test Circuit
*Includes all probe and jig capacitance
Figure 4. Test Circuit
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