10XS4200 データシートの表示（PDF） - Freescale Semiconductor
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10XS4200 Datasheet PDF : 60 Pages
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ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 3. Static Electrical Characteristics (continued)
Unless specified otherwise: 8.0 V ≤ VPWR ≤ 36 V, 3.0 V ≤ VDD ≤ 5.5 V, - 40 °C ≤ TA ≤ 125 °C, GND = 0 V. Typical values are
average values evaluated under nominal conditions TA = 25 °C, VPWR = 28 V & VDD = 5.0 V, unless specified otherwise.
parameter
Symbol
Min
Typ
Max
Unit
ELECTRICAL CHARACTERISTICS OF THE OUTPUT STAGE (HS0 AND HS1) (CONTINUED)
Over-current Detection thresholds with CSNS_ratio bit = 1(CSR1)
OCH1_1
18.3
22
26.5
A
OCH2_1
11.7
14.0
16.3
OCM1_1
7.2
8.7
10.1
OCM2_1
4.4
5.3
6.2
OCL1_1
3.0
3.6
4.2
OCL2_1
2.0
2.4
2.8
OCL3_1
0.96
1.2
1.44
Output pin leakage Current in sleep state (positive value = outgoing)
IOUT_LEAK
VHS,OFF = 0 V (VHS,OFF = output voltage in OFF state)
–
–
VHS,OFF = VPWR, device in sleep state (VPWR = 24 V max.)
-40.0
–
µA
+11
+5.0
Switch Turn-on threshold for Supply over-voltage (VPWR -GND) (see (13)) VD_GND(CLAMP)
58
–
66
V
Switch turn-on threshold for Drain-Source over-voltage (measured at
IOUT = 500 mA, see Figure 19)
Current Sensing Ratio(14)
CSNS_ratio bit = 0 (high current mode)
CSNS_ratio bit = 1 (low current mode)
Minimum measurable load current with compensated error (15)
VDS(CLAMP)
CSR0
CSR1
I_LOAD_MIN
58
–
66
V
–
–
1/3000
–
–
1/1000
–
–
–
100
mA
CSNS leakage current in OFF state (CSNSx_en = 0, CSNS_ratio bit_x = 0)
ICSR_LEAK
-4.0
–
+4.0
µA
Systematic offset error (seeCurrent Sense Errors)
I_LOAD_ERR_SYS
–
11
–
mA
Random offset error
I_LOAD_ERR_RAND
-150
–
150
mA
Notes:
13. Current Sense Ratio CSRx = ICSNS / IHS[x]
14. ESRx_ERR=(ICSNS_MEAS / ICSNS_MODEL) -1, with ICSNS_MODEL = (I(HS[x])+ I_LOAD_ERR_SYS) * CSRx , (I_LOAD_ERR_SYS defined above, see
section Current Sense Error Model). With this model, load current becomes: I(HS[x]) = ICSNS / CSRx - I_LOAD_ERR_SYS
15. See note (14), but with ICSNS_MEAS obtained after compensation of I_LOAD_ERR_RAND (see Activation and Use of Offset Compensation).
Further accuracy improvements can be obtained by performing a 1- or 2 point calibration.
10XS4200
10
Analog Integrated Circuit Device Data
Freescale Semiconductor
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