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K4B4G1646B データシート - Samsung

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部品番号
K4B4G1646B

コンポーネント説明

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Samsung
Samsung Samsung

The 4Gb DDR3 SDRAM B-die is organized as a 32Mbit x 16 I/Os x 8banks, device. This synchronous device achieves high speed double-data-rate transfer rates of up to 2133Mb/sec/pin (DDR3-2133) for general applications.


KEY FEATUREs
• JEDEC standard 1.5V(1.425V~1.575V)
• VDDQ = 1.5V(1.425V~1.575V)
• 400 MHz fCK for 800Mb/sec/pin, 533MHz fCK for 1066Mb/sec/pin,
   667MHz fCK for 1333Mb/sec/pin, 800MHz fCK for 1600Mb/sec/pin,
   933MHz fCK for 1866Mb/sec/pin, 1066 MHz fCK for 2133Mb/sec/pin
• 8 Banks
• Programmable CAS Latency(posted CAS): 5,6,7,8,9,10,11,12,13,14
• Programmable Additive Latency: 0, CL-2 or CL-1 clock
• Programmable CAS Write Latency (CWL) = 5 (DDR3-800), 6
   (DDR3-1066), 7 (DDR3-1333) , 8 (DDR3-1600), 9 (DDR3-1866) and
   10 (DDR3-2133)
• 8-bit pre-fetch
• Burst Length: 8 (Interleave without any limit, sequential with starting
   address “000” only), 4 with tCCD = 4 which does not allow seamless
   read or write [either On the fly using A12 or MRS]
• Bi-directional Differential Data-Strobe
• Internal(self) calibration : Internal self calibration through ZQ pin
   (RZQ : 240 ohm ± 1%)
• On Die Termination using ODT pin
• Average Refresh Period 7.8us at lower than TCASE 85°C, 3.9us at
   85°C < TCASE < 95 °C
• Support Industrial Temp ( -40 ∼ 85°C )
• Asynchronous Reset
• Package : 96 balls FBGA - x16
• All of Lead-Free products are compliant for RoHS
• All of products are Halogen-free

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部品番号
コンポーネント説明
PDF
メーカー
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