Description
The Edge710 is a totally monolithic ATE pin electronics solution manufactured in a high-performance complementary bipolar process. In Automatic Test Equipment (ATE) applications, the Edge710 incorporates
a driver, a load, and a window comparator suitable for very fast bidirectional channels in VLSI, Mixed-Signal, and
Memory test systems.

FEATUREs
• Fully Integrated Three-Statable Driver, Window Comparator, and Dynamic Active Load
• 12V Driver, Load, Compare Range
• 13V Super Voltage Capable
• ±35 mA Programmable Load
• Comparator Input Tracking >6V/ns
• Leakage (L+D+C) < 1 µA (normal mode)
• Leakage (L+D+C) < 25 nA (IPD mode)
• Small footprint (52 pin MQFP)

APPLICATIONs
• VLSI Test Equipment
• Mixed-Signal Test Equipment
• Memory Testers (Bidirectional Channels)
• ASIC Verifiers