CY7C1041DV33 データシートの表示（PDF） - Cypress Semiconductor
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CY7C1041DV33 Datasheet PDF : 17 Pages
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CY7C1041DV33
Capacitance[7]
Parameter
Description
CIN
COUT
Input capacitance
I/O capacitance
Thermal Resistance[7]
Parameter
Description
ΘJA Thermal resistance
(junction to ambient)
ΘJC Thermal resistance
(junction to case)
Test Conditions
Max
Unit
TA = 25 °C, f = 1 MHz, VCC = 3.3 V
8
pF
8
pF
Test Conditions
Still Air, soldered on a 3 × 4.5 inch,
four layer printed circuit board
FBGA
Package
27.89
SOJ
Package
57.91
TSOP II
Package
50.66
14.74
36.73
17.17
Unit
°C/W
°C/W
AC Test Loads and Waveforms
The AC test loads and waveform diagram follows.[8]
10 ns device
OUTPUT
Z = 50 Ω
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
50 Ω
1.5V
High-Z Characteristics
3.3V
OUTPUT
5 pF
(a)
R 317Ω
R2
351Ω
(c)
3.0V
30 pF*
GND
ALL INPUT PULSES
90%
90%
10%
10%
Rise Time: 1 V/ns
(b)
Fall Time: 1 V/ns
Notes
7. Tested initially and after any design or process changes that may affect these parameters.
8. AC characteristics (except high Z) are tested using the load conditions shown in AC Test Loads and Waveforms (a). High Z characteristics are tested for all speeds
using the test load shown in (c).
Document Number: 38-05473 Rev. *I
Page 5 of 17
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