IN74ACT299DW データシートの表示（PDF） - IK Semicon Co., Ltd

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IN74ACT299DW

8-Bit Bidirectional Universal Shift Register with Parallel I/O

IK Semicon Co., Ltd 

IN74ACT299

DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)

Symbol

Parameter

Test Conditions

VCC Guaranteed Limits

V 25 °C -40°C to Unit

85°C

VIH Minimum High-

VOUT= 0.1 V or VCC-0.1 V

4.5

2.0

2.0

V

Level Input Voltage

5.5

2.0

2.0

VIL Maximum Low -

VOUT= 0.1 V or VCC-0.1 V

4.5

0.8

0.8

V

Level Input Voltage

5.5

0.8

0.8

VOH Minimum High-

IOUT ≤ -50 µA

Level Output Voltage

*VIN=VIH or VIL

IOH=-24 mA

IOH=-24 mA

VOL Maximum Low-

IOUT ≤ 50 µA

Level Output Voltage

*VIN= VIH or VIL

IOL=24 mA

IOL=24 mA

IIN

Maximum Input

Leakage Current

VIN=VCC or GND

4.5

4.4

4.4

V

5.5

5.4

5.4

4.5 3.86

3.76

5.5 4.86

4.76

4.5

0.1

0.1

V

5.5

0.1

0.1

4.5 0.36

0.44

5.5 0.36

0.44

5.5 ±0.1

±1.0

µA

∆ICCT

IOZ

IOLD

Additional Max.

ICC/Input

Maximum Three-

State Leakage

Current

+Minimum Dynamic

Output Current

VIN=VCC - 2.1 V

VIN (OE)= VIH or VIL

VIN =VCC or GND

VOUT =VCC or GND

VOLD=1.65 V Max

5.5

5.5 ±0.6

5.5

1.5

mA

±6.0

µA

75

mA

IOHD +Minimum Dynamic VOHD=3.85 V Min

5.5

Output Current

-75

mA

ICC

Maximum Quiescent VIN=VCC or GND

Supply Current

(per Package)

5.5

8.0

* All outputs loaded; thresholds on input associated with output under test.

+Maximum test duration 2.0 ms, one output loaded at a time.

80

µA

Rev. 00

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