AD12400(Rev0) データシートの表示（PDF） - Analog Devices
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AD12400 Datasheet PDF : 28 Pages
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AD12400
AD12400JWS
AD12400KWS
Parameter
Case Temp
Test Level
Min Typ Max Min Typ Max Unit
DR Propagation Delay (tEDR)
60°C
V
3.88
3.88
ns
Data to DR Skew (tEDR − tPD)
Pipeline Latency7
60°C
V
Full
IV
2.68
2.68
ns
40
40
Cycles
Aperture Delay (tA)
60°C
V
1.6
1.6
ns
Aperture Uncertainty (Jitter, tJ)
60°C
V
0.4
0.4
ps rms
1 All ac specifications tested with a single-ended 2.0 V p-p ENCODE.
2 Dynamic performance guaranteed for analog input frequencies of 10 MHz to 180 MHz.
3 Not including image spur.
4 Image spur will be at fs/2–AIN and the offset spur will be at fs/2.
5 F1 = 70 MHz, F2 = 73 MHz.
6 Parts are tested with 400 MSPS encode. Device can be clocked at lower encode rates, but specifications are not guaranteed. Specifications will be guaranteed by
design for encode 400 MSPS ± 1%.
7Pipeline latency will be exactly 40 cycles.
EXPLANATION OF TEST LEVELS
I
100% production tested.
II
100% production tested at 25°C and sample tested at specified temperatures.
III
Sample tested only.
IV
Parameter is guaranteed by design and characterization testing.
V
Parameter is a typical value only.
VI
100% production tested at 25°C; guaranteed by design and characterization testing for industrial temperature range; 100%
production tested at temperature extremes for military devices.
Rev. 0 | Page 5 of 28
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