TC58NVG1S3BFT00 データシートの表示（PDF） - Toshiba

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TC58NVG1S3BFT00

TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

Toshiba 

TC58NVG1S3BFT00/TC58NVG1S8BFT00

(13) Invalid blocks (bad blocks)

The device occasionally contains unusable blocks. Therefore, the following issues must be recognized:

Bad Block

Bad Block

At the time of shipment, all data bytes in a valid block are FFh. For bad

blocks, all bytes are not in the FFh state. Please do not perform an erase

operation to bad blocks. It may be impossible to recover the bad block

information if the information is erased.

Check if the device has any bad blocks after installation into the system.

Refer to the test flow for bad block detection. Bad blocks which are

detected by the test flow must be managed as unusable blocks by the

system.

A bad block does not affect the performance of good blocks because it is

isolated from the bit lines by select gates.

The number of valid blocks at the time of shipment is as follows:

MIN

TYP.

MAX

UNIT

Valid (Good) Block Number

2008



2048

Block

Bad Block Test Flow

Start

Block No = 1

Read Check: Read either column 0 or 2048 of the

1st page or the 2nd page of each

block. If the data of the column is

not FF (Hex), define the block as a

bad block.

Block No. = Block No. + 1

Read Check

Pass

Fail

Bad Block *1

No

Block No. = 2048

Yes

End

*1: No erase operation is allowed to detected bad blocks

34

2003-10-30A

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