DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
MC74HC365A
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kΩ
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 3.
*Includes all probe and jig capacitance
Figure 4.
LOGIC DETAIL
TO OTHER
FIVE BUFFERS
ONE OF 6
BUFFERS
VCC
Y
INPUT A
OUTPUT ENABLE 1
OUTPUT ENABLE 2
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