ADG821/ADG822/ADG823
Test Circuits
IDS
V1
S
D
VS
RON = V1/IDS
Test Circuit 1. On Resistance
IS (OFF)
S
A
VS
ID (OFF)
D
A
VD
Test Circuit 2. Off Leakage
NC
S
ID (ON)
D
A
VD
NC = NO CONNECT
Test Circuit 3. On Leakage
VDD
0.1F
VDD
S
D
VOUT
VS
IN
RL
50⍀
CL
35pF
GND
VIN ADG821 50%
VIN ADG822 50%
VOUT
90%
tON
50%
50%
90%
tOFF
Test Circuit 4. Switching Times
VDD
0.1F
VS1
S1
VS2
S2
IN1, IN2
VIN
VDD
GND
D1
D2
RL2
50⍀
VOUT2
CL2
35pF
RL1
50⍀
VOUT1
CL1
35pF
VIN
0V
VOUT1
0V
50%
90%
VOUT2
90%
0V
tBBM
50%
90%
90%
tBBM
Test Circuit 5. Break-Before-Make Time Delay, tBBM (ADG823 only)
RS
VS
VDD
VDD
S
D
IN
GND
SW ON
VOUT
CL
1nF
VIN
VOUT
SW OFF
QINJ = CL ؋ ∆VOUT
⌬VOUT
Test Circuit 6. Charge Injection
–8–
REV. 0