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5B34 データシートの表示(PDF) - Analog Devices

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5B34
ADI
Analog Devices ADI
5B34 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Output Rise Time, 10% to 90% Span
Input-to-Output, Continuous
Output-to-Power, Continuous4
Transient
1 kSource Imbalance, 50/60 Hz
Normal Mode Rejection 50/60 Hz
100Pt, 120Ni
10Cu
100Pt, 120Ni
10Cu
Continuous
Transient
Output Resistance
Voltage Output Protection
Output Selection Time
Max Logic "0"
Min Logic "1"
Max Logic "1"
Input Current "0"
Power Supply Voltage
Power Supply Current
100Pt, 120Ni
10Cu
Mechanical Dimensions
Rated Performance
Operating
Storage
Relative Humidity
RFI Susceptibility
200 ms
Common-Mode Voltage (CMV)
1500 V rms, maximum
±3 V, maximum
ANSI/IEEE C37.90.1-1989
Common Mode Rejection (CMR)
160 dB
60 dB
Sensor Excitation Current
0.25 mA
1.0 mA
Lead Resistance Effect
±0.02°C/
±0.2°C/
Input Protection
240 V rms, maximum
ANSI/IEEE C37.90.1-1989
50
Continuous Short to Ground
6 µs @ Cload = 0 to 2,000 pF
Output Enable Control
+1 V
+2.5 V
+36 V
0.4 mA
+5 V ±5%
30 mA
Power Supply Sensitivity, RTI
±0.05°C/V
±0.5°C/V
2.275" x 2.375" x 0.595" (57.8 mm x 59.1 mm x 15.1 mm)
Environmental
-25°C to +85°C
-40°C to +85°C
-40°C to +85°C
0 to 93% @ +40°C non-condensing
±0.5% Span error @ 400 MHz, 5 Watt, 3 ft
* ±0.025For Cu RTD's; ±0.1For Ni RTD's.
1 Rz is the value of the RTD resistance at the lowest point of the measurement range.
2 Includes the combined effects of repeatability, hysteresis,
and conformity error. Loads heavier than 50 kwill degrade conformity and gain temperature coefficient.
3 For Pt RTD's only; other types may vary.
4 The output common must be kept within ±3 V of power common.
Specifications subject to change without notice.
Rev. 0 | Page 4 of 8
5B34

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