JANKCA1N5550US データシートの表示（PDF） - Unspecified

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JANKCA1N5550US

SEMICONDUCTOR DEVICE, DIODE,SILICON, POWER, RECTIFIER

Unspecified 

MIL-PRF-19500/420H

* 4.4.3.1 Group C inspection, table VII of MIL-PRF-19500.

Subgroup

Method Condition

C2

1056 0°C to +100°C, 10 cycles.

C2

1051 -55°C to +175°C, 25 cycles.

C2

2036 Tension: Test condition A; weight = 5 pounds; t = 30 seconds.

Lead fatigue: Test condition E; weight 2 pounds.

NOTE: Both tension and lead fatigue are not applicable for US devices.

*

C5

3101

or

4081

See 4.5.5.

C6

1027 TJ = 150°C minimum (see 4.5.2.1). IO = IO2 = 3 A dc minimum; adjust IO to

achieve the required TJ; apply VR = rated VRWM (see col. 3 of 1.3), f = 50-60 Hz

(see 4.5.2.1).

* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for

subgroup testing in appendix E, table IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-

points) shall be in accordance with table I, subgroup 2 herein. See table III for delta limits when applicable.

4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows.

4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.

4.5.2 Burn-in and life tests. These tests shall be conducted with a half-sine waveform of the specified peak

voltage impressed across the diode in the reverse direction followed by a half-sine waveform of the specified

average rectified current. The forward conduction angle of the rectified current shall be neither greater than 180

degrees, nor less than 150 degrees.

* 4.5.2.1 Free air burn-in. Deliberate heat sinking, baffles to create an oven, forced air-cooling or heating is

prohibited unless otherwise approved by the qualifying activity. The use of a current limiting or ballast resistor is

permitted provided that each DUT still sees the full Pt (minimum) and that the minimum applied voltage, where

applicable, is maintained through out the burn-in period. TJ = 135°C minimum for screening and TJ = 150°C for 4.4.2

and 4.4.3 life tests. Use method 3100 of MIL-STD-750 to measure TJ.

4.5.3 Scope display evaluation. Scope display evaluation shall be sharp and stable in accordance with method

4023 of MIL-STD-750. Scope display may be performed on ATE (automatic test equipment) for screening only, with

the approval of the qualifying activity. Scope display in table I, subgroup 4 shall be performed on a scope. The

reverse current (IBR) over the knee shall be 500 µA peak.

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