ADIS16209(Rev0) データシートの表示（PDF） - Analog Devices
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ADIS16209 Datasheet PDF : 16 Pages
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ADIS16209
Parameter
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Logic 1 Input High Current, IINH
Logic 0 Input Low Current, IINL
All except RST
RST3
Input Capacitance, CIN
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
SLEEP TIMER
Timeout Period4
START-UP TIME5
Power-On
Reset Recovery
Sleep Mode Recovery
FLASH MEMORY
Endurance6
Data Retention7
CONVERSION RATE SETTING
POWER SUPPLY
Operating Voltage Range
Power Supply Current
Conditions
Min
Typ
2.0
For CS signal when used to wake up from sleep mode
VIH = 3.3 V
VIL = 0 V
±0.2
−40
−1
10
ISOURCE = 1.6 mA
2.4
ISINK = 1.6 mA
Time until data is available
Fast mode, SMPL_PRD ≤ 0x07
Normal mode, SMPL_PRD ≥ 0x08
Fast mode, SMPL_PRD ≤ 0x07
Normal mode, SMPL_PRD ≥ 0x08
0.5
150
190
30
70
2.5
TJ = 85°C
20,000
20
1.04
Normal mode, SMPL_PRD ≥ 0x08
Fast mode, SMPL_PRD ≤ 0x07
Sleep mode, −40°C to +85°C
3.0
3.3
11
36
140
Max
0.8
0.55
±10
−60
0.4
128
2731
3.6
14
42
350
Unit
V
V
V
μA
μA
mA
pF
V
V
Seconds
ms
ms
ms
ms
ms
Cycles
Years
SPS
V
mA
mA
μA
1 Guaranteed by iMEMS® packaged part testing, design, and/or characterization.
2 Self-test response changes as the square of VDD.
3 The RST pin has an internal pull-up.
4 Guaranteed by design.
5 The times presented in this section do not include the sensor’s transient response time, which is associated with a 50 Hz single-pole system. System accuracy goals
should be given consideration when determining the amount of time it takes to start acquiring accurate readings. These times do not include the time it takes to
arrive at thermal stability, which can also introduce transient errors.
6 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
7 Retention lifetime equivalent at junction temperature (TJ) 55°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
Rev. 0 | Page 4 of 16
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