IDT71V016, 3.3V CMOS Static RAM
1 Meg (64K x 16-Bit)
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
1.5ns
1.5V
1.5V
See Figure 1, 2 and 3
3211 tbl 09
Commercial and Industrial Temperature Ranges
AC Test Loads
IN NCEA DATAOUT
RT CE 16S NS 30pF*
3.3V
320Ω
350Ω
3211 drw 04
DATA OUT
5pF*
3.3V
320Ω
350Ω
3211 drw 05
PA LES71V0DESIG Figure 1. AC Test Load
*Including jig and scope capacitance.
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
SODER EW 7
BR N •
6
O O R ∆tAA, tACS
(Typical, ns) 5
FO 4
3
•
•
2
•
1
•
•
•
8 20 40 60 80 100 120 140 160 180 200
CAPACITANCE (pF)
3211 drw 06
Figure 3. Output Capacitive Derating
6.442