![](/html/Motorola/926309/page5.png)
MC74LVX245
Input
A or B
50%
tPLH
Output
B or A
50% VCC
Figure 3.
SWITCHING WAVEFORMS
T/R
VCC
GND
tPHL
OE
A or B
A or B
50% VCC
tPZL tPLZ
50% VCC
tPZH tPHZ
50% VCC
Figure 4.
50%
50% VCC
VCC
GND
VCC
GND
HIGH
IMPEDANCE
VOL +0.3V
VOH –0.3V
HIGH
IMPEDANCE
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kΩ
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
* Includes all probe and jig capacitance
Figure 5. Propagation Delay Test Circuit
* Includes all probe and jig capacitance
Figure 6. Three–State Test Circuit
LCX DATA
5
BR1339 — REV 3
MOTOROLA