UTCLAG665F LINEAR INTEGRATED CIRCUIT
PARAMETER
Reference Voltage Change I
Reference Voltage Change II
Reference Voltage Change III
Current Factor
Current Factor Change I
Current Factor Change II
Current Factor Change III
Saturation Voltage at Forced ON
Input Impedance at Forced ON
Pin
Leakage Current at Forced OFF
Input Impedance at Forced OFF
Pin
SYMBOL
Vref 1
Vref 2
Vref 3
K
K1
K2
K3
VCEsa
Rion
IML
Ricon
TEST CONDITIONS MIN TYP MAX UNIT
Vcc=2.1~5V
0.05
%/V
Im=25~250mA
0.01
%/mA
Ta=-10~50°C
0.01
%/°C
32
38
43
Vcc=2.1~5V
0.5
%/V
Im=25~250mA
0.05
%/mA
Ta=-10~50°C
0.02
%/°C
IM=200mA, Pin 14=Vcc
0.6
V
5.6
KΩ
200
µA
33
KΩ
TEST CIRCUIT
NOTE1 :
NOTE2 :
SW12,SW12
R1,R’ =33kΩ
R2,R2’ =5.1kΩ
R3,R3’ =200kΩ
R2,R2,=5.1kΩ
C1,C’ =0.1µF
See figure 1 for SW
UTC UNISONIC TECHNOLOGIES CO., LTD. 4
QW-R110-013,A