IDT7188L データシートの表示（PDF） - Integrated Device Technology
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IDT7188L Datasheet PDF : 8 Pages
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IDT7188S/L
CMOS Static RAM 64K (16K x 4-Bit)
Data Retention Characteristics
(L Version Only) (VHC = VCC - 0.2V)
Symbol
Parameter
VDR
ICCDR
tCDR(3)
tR(3)
IILII(3)
VCC for Data Retention
Data Retention Current
Chip Deselect to Data Retention Time
Operation Recovery Time
Input Leakage Current
Test
Condition
Min.
____
2.0
____
CS > VHC
0
VIN > VHC or
< VLC
tRC(2)
____
NOTES:
1. TA = +25°C.
2. tRC = Read Cycle Time.
3. This parameter is guaranteed by device characterization but is not production tested.
Military Temperature Range
Typ.(1)
VCC @
2.0V
3.0V
____
____
10
15
____
____
____
____
____
____
Max.
VCC @
2.0V
3.0V
____
____
600
900
____
____
____
____
2
2
Unit
V
µA
ns
ns
µA
2989 tbl 09
Low VCC Data Retention Waveform
DATA
RETENTION
MODE
VCC
4.5V
t CDR
VDR≥ 2V
CS
VIH
VDR
4.5V
tR
VIH
,
2989 drw 03
AC Test Conditions
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
5ns
1.5V
1.5V
See Figures 1 and 2
2989 tbl 10
5V
5V
DATAOUT
480Ω
DATA OUT
480Ω
255Ω
30pF*
,
2989 drw 04
Figure 1. AC Test Load
*Includes scope and jig capacitances
255Ω
5pF*
,
2989 drw 05
Figure 2. AC Test Load
(for tHZ, tLZ, tWZ, tOHZ and tOW)
4
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