BCR3KM-12
Holding Current vs.
Junction Temperature
103
7
Typical Example
5
4
3
2
102
7
5
4
3
2
101
–60 –40 –20 0 20 40 60 80 100 120 140
Junction Temperature (°C)
Breakover Voltage vs.
Junction Temperature
160
Typical Example
140
120
100
80
60
40
20
0
–60 –40 –20 0 20 40 60 80 100 120 140
Junction Temperature (°C)
Gate Trigger Current vs.
Gate Current Pulse Width
103
7
IRGT III
Typical Example
5
4
IRGT I
3
IFGT I
2
102
7
5
4
3
2
101
100 2 3 4 5 7 101 2 3 4 5 7 102
Gate Current Pulse Width (µs)
Latching Current vs.
Junction Temperature
103
7
5
3
Distribution
2
T2+, G–
102
Typical Example
7
5
3
2
101
7
5
3
2
T2+, G+
T2–, G–
Typical Example
100
–60 –40 –20 0 20 40 60 80 100 120 140
Junction Temperature (°C)
Breakover Voltage vs.
Rate of Rise of Off-State Voltage
160
Typical Example
140
Tj = 125°C
120
100
III Quadrant
80
60
I Quadrant
40
20
0
101 2 3 5 7 102 2 3 5 7 103 2 3 5 7 104
Rate of Rise of Off-State Voltage (V/µs)
Gate Trigger Characteristics Test Circuits
6Ω
6Ω
6V
A
V
330Ω
Test Procedure I
6Ω
6V
A
V
330Ω
Test Procedure II
6V
A
V
330Ω
Test Procedure III
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