TC74LCX240FK データシートの表示（PDF） - Toshiba
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TC74LCX240FK Datasheet PDF : 11 Pages
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Pin Assignment (top view)
TC74LCX240F/FT/FK
IEC Logic Symbol
1OE 1
1A1 2
2Y4 3
1A2 4
2Y3 5
1A3 6
2Y2 7
1A4 8
2Y1 9
GND 10
20 VCC
19 2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y 4
11 2A1
1
1OE
EN
2
1A1
4
1A2
6
1A3
8
1A4
19
2OE
EN
11
2A1
13
2A2
15
2A3
17
2A4
18
1Y1
16
1Y 2
14
1Y3
12
1Y 4
9
2 Y1
7
2Y2
5
2Y3
3
2Y4
Truth Table
Inputs
OE
An
L
L
L
H
H
X
X: Don’t care
Z: High impedance
Outputs
H
L
Z
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Power supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
Power dissipation
DC VCC/ground current
Storage temperature
VCC
VIN
VOUT
IIK
IOK
IOUT
PD
ICC/IGND
Tstg
−0.5 to 7.0
V
−0.5 to 7.0
V
−0.5 to 7.0 (Note 2)
−0.5 to VCC + 0.5
V
(Note 3)
−50
mA
±50 (Note 4) mA
±50
mA
180
mW
±100
mA
−65 to 150
°C
Note 1:
Note 2:
Note 3:
Note 4:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Output in OFF state
High or low state. IOUT absolute maximum rating must be observed.
VOUT < GND, VOUT > VCC
2
2010-01-31
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