TFDS4400 データシートの表示（PDF） - Vishay Semiconductors
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TFDS4400 Datasheet PDF : 14 Pages
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TFDS4400
Vishay Semiconductors
Absolute Maximum Ratings
Reference point Pin GND unless otherwise noted.
Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
Parameters
Test Conditions
Symbol Min. Typ.
Supply Voltage Range
Input Currents
0 V ≤ VCC2 ≤ 6 V
0 V ≤ VCC1 ≤ 6 V
For all Pins,
except IRED Anode Pin
VCC1
VCC2
– 0.5
– 0.5
Output Sink Current
Power Dissipation
Junction Temperature
Ambient Temperature
Range (Operating)
See Derating Curve
PD
TJ
Tamb
–25
Storage Temperature
Range
Tstg
–25
Soldering Temperature See Recommended
215
Solder Profile
Average IRED Current
Repetitive Pulsed IRED
Current
t < 90 µs, ton < 20%
IIRED (DC)
IIRED (RP)
IRED Anode Voltage
Transmitter Data Input
Voltage
VIREDA
VTxd
– 0.5
– 0.5
Receiver Data Output
Voltage
VRxd
– 0.5
Virtual Source Size
Method:
d
(1–1/e) encircled energy
2.5
2.8
Maximum Intensity for
Class 1 Operation of
IEC825–1 or EN60825–1
(worst case IrDA SIR
pulse pattern *)
EN60825, 1997
Max.
6
6
10
25
200
125
+85
+85
240
100
500
6
VCC1+0.5
VCC1+0.5
400
Unit
V
V
mA
mA
mW
°C
°C
°C
°C
mA
mA
V
V
V
mm
mW/sr
*) Note:
Transmitted data: continuously transmitted “0”. In normal data transfer operation “0” and “1” will be transmitted
with the same probability. Therefore, for that case, about a factor of two of safety margin is included. However,
for worst case thermal stress testing such data pattern are often used and for this case the 400 mW/sr value
has to be taken.
Document Number 82524
Rev. A1.5, 31-May-00
www.vishay.com
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