TB62706 データシートの表示（PDF） - Toshiba

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コンポーネント説明

一致するリスト

TB62706

Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

TEST CIRCUIT

DC characteristic

AC characteristic

TB62706BN/BF

PRECAUTIONS for USING

Utmost care is necessary in the design of the output line, VCC (VDD) and GND line since IC may be destroyed

due to short−circuit between outputs, air contamination fault, or fault by improper grounding.

7

2006-06-14

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