PM7524 データシートの表示（PDF） - Analog Devices

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PM7524

CMOS 8-Bit Buffered Multiplying DAC

Analog Devices 

AD7524

ABSOLUTE MAXIMUM RATINGS*

(TA = +25°C, unless otherwise noted)

VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V

VRFB to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 25 V

VREF to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 25 V

Digital Input Voltage to GND . . . . . . . . –0.3 V to VDD +0.3 V

OUT1, OUT2 to GND . . . . . . . . . . . . . –0.3 V to VDD +0.3 V

*Stresses above those listed under “Absolute Maximum Ratings” may cause

permanent damage to the device. This is a stress rating only and functional

operation of the device at these or any other conditions above those indicated in the

operational sections of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Power Dissipation (Any Package)

To +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 450 mW

Derates above 75°C by . . . . . . . . . . . . . . . . . . . . 6 mW/°C

Operating Temperature

Commercial (J, K, L) . . . . . . . . . . . . . . . . . –40°C to +85°C

Industrial (A, B, C) . . . . . . . . . . . . . . . . . . –40°C to +85°C

Extended (S, T, U) . . . . . . . . . . . . . . . . . –55°C to +125°C

Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C

Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the AD7524 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

WARNING!

ESD SENSITIVE DEVICE

TERMINOLOGY

with all 1s in the DAC after offset error has been adjusted out

RELATIVE ACCURACY: A measure of the deviation from a and is expressed in LSBs. Gain Error is adjustable to zero with

straight line through the end points of the DAC transfer function. an external potentiometer.

Normally expressed as a percentage of full scale range. For the

AD7524 DAC, this holds true over the entire VREF range.

FEEDTHROUGH ERROR: Error caused by capacitive cou-

pling from VREF to output with all switches OFF.

RESOLUTION: Value of the LSB. For example, a unipolar con- OUTPUT CAPACITANCE: Capacity from OUT1 and

verter with n bits has a resolution of (2–n) (VREF). A bipolar con- OUT2 terminals to ground.

verter of n bits has a resolution of [2–(n–1)] [VREF]. Resolution in no

way implies linearity.

OUTPUT LEAKAGE CURRENT: Current which appears

on OUT1 terminal with all digital inputs LOW or on OUT2

GAIN ERROR: Gain Error is a measure of the output error be- terminal when all inputs are HIGH. This is an error current

tween an ideal DAC and the actual device output. It is measured which contributes an offset voltage at the amplifier output.

DIP, SOIC

PIN CONFIGURATIONS

PLCC

LCCC

REV. B

–3–

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