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MC10E104FNG(2016) データシートの表示(PDF) - ON Semiconductor

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MC10E104FNG
(Rev.:2016)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC10E104FNG Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
MC10E104, MC100E104
Table 6. 100E SERIES PECL DC CHARACTERISTICS (VCCx = 5.0 V; VEE = 0.0 V (Note 1))
40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE Power Supply Current
VOH Output HIGH Voltage (Note 2)
VOL Output LOW Voltage (Note 2)
VIH Input HIGH Voltage
VIL Input LOW Voltage
IIH
Input HIGH Current
IIL
Input LOW Current
38
46
38
46
44
53 mA
3975 4050 4120 3975 4050 4120 3975 4050 4120 mV
3190 3295 3380 3190 3255 3380 3190 3260 3380 mV
3835 3975 4120 3835 3975 4120 3835 3975 4120 mV
3190 3355 3525 3190 3525 3355 3190 3355 3525 mV
200
200
200 mA
0.5 0.3
0.5 0.25
0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. Input and output parameters vary 1:1 with VCC. VEE can vary 0.46 V / +0.8 V.
2. Outputs are terminated through a 50 W resistor to VCC 2.0 V.
Table 7. 100E SERIES NECL DC CHARACTERISTICS (VCCx = 0 V; VEE = 5.0 V (Note 1))
40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
IEE Power Supply Current
VOH Output HIGH Voltage (Note 2)
VOL Output LOW Voltage (Note 2)
VIH Input HIGH Voltage
VIL Input LOW Voltage
IIH
Input HIGH Current
IIL
Input LOW Current
38
46
38
46
44
53 mA
1025 950 880 1025 950 880 1025 950 880 mV
1810 1705 1620 1810 1745 1620 1810 1740 1620 mV
1165 1025 880 1165 1025 880 1165 1025 880 mV
1810 1645 1475 1810 1645 1475 1810 1645 1475 mV
200
200
200 mA
0.5 0.3
0.5 0.25
0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. Input and output parameters vary 1:1 with VCC. VEE can vary 0.46 V / +0.8 V.
2. Outputs are terminated through a 50 W resistor to VCC 2.0 V.
Table 8. AC CHARACTERISTICS (VCCx= 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = 5.0 V (Note 1))
40°C
25°C
Symbol
fMAX
tPLH
tPHL
Characteristic
Maximum Toggle Frequency
Propagation Delay to Output
D to Q
D to F
Min Typ Max Min Typ Max Min
700
700
225 385 600 225 385 600 225
500 725 1000 500 725 1000 500
tSKEW Within-Device Skew (Note 2)
D to Q
75
75
tJITTER
tr
tf
Random Clock Jitter (RMS)
Rise/Fall Time (2080%)
Q
F
<1
<1
100 425 700 100 425 700 100
300 475 700 300 475 700 300
85°C
Typ
700
385
725
75
<1
425
475
Max
600
1000
Unit
MHz
ps
ps
ps
ps
700
700
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: VEE can vary 0.46 V / +0.06 V.
100 Series: VEE can vary 0.46 V / +0.8 V.
2. Within-device skew is defined as identical transitions on similar paths through a device.
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