ADIS16250 データシートの表示（PDF） - Analog Devices

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ADIS16250

Dual-Axis Digital Inclinometer and Accelerometer

Analog Devices 

ADIS16250/ADIS16255

Parameter

DAC OUTPUT

Resolution

Relative Accuracy

Differential Nonlinearity

Offset Error

Gain Error

Output Range

Output Impedance

Output Settling Time

LOGIC INPUTS

Input High Voltage, VINH

Input Low Voltage, VINL

Logic 1 Input Current, IINH

Logic 0 Input Current, IINL

All except RST

RST3

Input Capacitance, CIN

DIGITAL OUTPUTS

Output High Voltage, VOH

Output Low Voltage, VOL

SLEEP TIMER

Timeout Period4

START-UP TIME

Initial

Sleep Mode Recovery

FLASH MEMORY

Endurance5

Data Retention6

CONVERSION RATE

Minimum Conversion Time

Maximum Conversion Time

Maximum Throughput Rate

Minimum Throughput Rate

POWER SUPPLY

Operating Voltage Range, VCC

Power Supply Current

Conditions

Min Typ

Max Unit

5 kΩ/100 pF to GND

12

Bits

For Code 101 to Code 4095

4

LSB

1

LSB

±5

mV

±0.5

%

0 to 2.5

V

2

Ω

10

μs

Internal 3.3 V Interface

2.0

V

0.8

V

For CS signal when used to wake up from sleep mode

0.55 V

VIH = 3.3 V

VIL = 0 V

±0.2

±10 μA

−40

−60 μA

−1

mA

10

pF

Internal 3.3 V Interface

ISOURCE = 1.6 mA

2.4

V

ISINK = 1.6 mA

0.4

V

0.5

128 sec

160

ms

2.5

ms

TJ = 55°C

10,000

20

Cycles

Years

3.906

ms

7.75

sec

256

SPS

0.129

SPS

Normal mode at 25°C

Fast mode at 25°C

Sleep mode at 25°C

4.75 5.0

18

44

425

5.25 V

mA

mA

μA

1 ADIS16255 characterization data represents ±4σ to fall within the ±1% limit.

2 The sensor is capable of ±600°/sec, but the specifications herein are for ±320°/sec only.

3 The RST pin has an internal pull-up.

4 Guaranteed by design.

5 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.

6 Retention lifetime equivalent at junction temperature (TJ) 55°C, as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.

Rev. D | Page 4 of 20

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