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ADE7757(2002) データシートの表示(PDF) - Analog Devices

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ADE7757
(Rev.:2002)
ADI
Analog Devices ADI
ADE7757 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
PRELIMINARY TECHNICAL DATA
ADE7757
TIMING CHARACTERISTICS1, 2
Parameter A, B Versions
(VDD = 5 V ؎ 5%, AGND = DGND = 0 V, On-Chip Reference, rCKLIN = 5 kΩ 0.1% 5ppm/°C,
TMIN to TMAX = –40؇C to +85؇C)
Units Test Conditions/Comments
t13
550
t2
See Table II
t3
1/2 t2
t43, 4
180
t5
See Table III
t6
TBD
ms F1 and F2 Pulsewidth (Logic Low)
sec Output Pulse Period. See Transfer Function Section
sec Time Between F1 Falling Edge and F2 Falling Edge
ms CF Pulsewidth (Logic High)
sec CF Pulse Period. See Transfer Function Section
sec Minimum Time Between F1 and F2 Pulse
NOTES
1Sample tested during initial release and after any redesign or process change that may affect this parameter.
2See Figure 1.
3The pulsewidths of F1, F2 and CF are not fixed for higher output frequencies. See Frequency Outputs Section.
4The CF pulse is always 18 µs in the high frequency mode. See Frequency Outputs section and Table III.
Specifications subject to change without notice.
t1
F1
.t6
.t2
F2
.t3
t4
.t5
CF
Figure 1. Timing Diagram for Frequency Outputs
Model
ADE7757ARN
EVAL-ADE7757EB
ORDERING GUIDE
Package Description
SOIC narrow-body
Evaluation Board
Package Options
RN-16
Evaluation Board
REV. PrC.
–3–

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