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STTH16003TV1 データシートの表示(PDF) - STMicroelectronics

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STTH16003TV1
ST-Microelectronics
STMicroelectronics ST-Microelectronics
STTH16003TV1 Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
STTH16003
Characteristics
Table 5.
Symbol
Recovery characteristics
Parameter
Test conditions
Min. Typ Max. Unit
trr Reverse recovery time
tfr
VFP
IRM
Sfactor
Forward recovery time
Forward recovery voltage
Reverse recovery current
Tj = 25 °C
IF = 0.5 A, Irr = 0.25 A
IR = 1 A
IF = 1 A, dIF/dt = 50 A/µs,
VR = 30 V
Tj = 25 °C
IF = 80 A dIF/dt = 200 A/µs
VFR = 1.1 x VFmax
Tj = 125 °C
IF = 60 A, dIF/dt = 200 A/µs,
Vcc = 200 V
60 ns
80 ns
1000 ns
5
V
16 A
0.3
-
Figure 1. Conduction losses versus
average current (per diode)
Figure 2.
Forward voltage drop versus
forward current (maximum values,
per diode)
P1(W)
100
90
80
70
δ = 0.05 δ = 0.1
δ = 0.2
δ = 0.5
δ=1
IFM(A)
200
100
Tj=125°C
(Typical values)
Tj=25°C
60
50
Tj=125°C
40
10
30
T
20
10
IF(av) (A)
δ=tp/T
tp
0
0 10 20 30 40 50 60 70 80 90 100
VFM(V)
1
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
Figure 3.
Relative variation of thermal
Figure 4.
impedance junction to case versus
pulse duration
Peak reverse recovery current
versus dIF/dt (90% confidence, per
diode)
Zth(j-c)/Rth(j-c)
1.0
0.8
0.6 δ = 0.5
0.4 δ = 0.2
δ = 0.1
0.2
Single pulse
0.0
1E-3
1E-2
tp(s)
1E-1
IRM(A)
30
VR=200V
Tj=125°C
25
20
IF=IF(av)
IF=0.5xIF(av)
IF=2xIF(av)
15
10
T
δ=tp/T
1E+0
tp
5E+0
5
dIF/dt(A/µs)
0
0 50 100 150 200 250 300 350 400 450 500
3/7

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