MC10H162FNR2G データシートの表示（PDF） - ON Semiconductor
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MC10H162FNR2G Datasheet PDF : 7 Pages
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LOGIC DIAGRAM
E0 2
E1 15
VCC1 = Pin 1
VCC2 = Pin 16
VEE = Pin 8
A7
B9
C 14
6 Q0
5 Q1
4 Q2
3 Q3
13 Q4
12 Q5
11 Q6
10 Q7
MC10H162
TRUTH TABLE
INPUTS
OUTPUTS
E0 E1 C B A Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
L L L LL H L L L L LL L
L L L LHL HL L L LL L
L L L HL L LHL L LL L
L L L HH L L L H L LL L
L L H LL L L L LH LL L
L L H LH L L L L L HL L
L L H HL L L L L L LH L
L L H HH L L L L L LL H
H X X XX L L L L L LL L
X H X XX L L L L L LL L
DIP
PIN ASSIGNMENT
VCC1
1
16
VCC2
E0 2 15 E1
Q3 3 14 C
Q2 4 13 Q4
Q1
5
12
Q5
Q0 6 11 Q6
A 7 10 Q7
VEE
8
9B
Pin assignment is for Dual−in−Line Package.
For PLCC pin assignment, see the Pin Conversion Tables on page 18
of the ON Semiconductor MECL Data Book (DL122/D).
Table 1. MAXIMUM RATINGS
Symbol
Characteristic
Rating
Unit
VEE
Power Supply (VCC = 0)
VI
Input Voltage (VCC = 0)
Iout
Output Current − Continuous
− Surge
−8.0 to 0
Vdc
0 to VEE
Vdc
50
mA
100
TA
Operating Temperature Range
Tstg
Storage Temperature Range − Plastic
− Ceramic
0 to +75
°C
−55 to +150
°C
−55 to +165
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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