9704-00 データシートの表示（PDF） - Peregrine Semiconductor Corp.

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9704-00

3.0 GHz Integer-N PLL for Rad Hard Applications

Peregrine Semiconductor Corp. 

Table 2. Absolute Maximum Ratings

Symbol

VDD

VI

II

IO

Tstg

Parameter/Conditions Min Max Units

Supply voltage

Voltage on any input

DC into any input

DC into any output

Storage temperature

range

-0.3 4.0

V

-0.3 VDD

V

+ 0.3

-10 +10 mA

-10 +10 mA

-65 150 °C

Table 3. Operating Ratings

Symbol

VDD

TA

Parameter/Conditions Min Max Units

Supply voltage

Operating ambient

temperature range

2.85 3.15

V

-40 85

°C

Table 4. ESD Ratings

Symbol

VESD

Parameter/Conditions

ESD voltage (Human Body

Model) – Note 1

Level Units

1000

V

Note 1: Periodically sampled, not 100% tested. Tested per MIL-

STD-883, M3015 C2

PE9704

Advance Information

Electrostatic Discharge (ESD) Precautions

When handling this UTSi device, observe the same

precautions that you would use with other ESD-

sensitive devices. Although this device contains

circuitry to protect it from damage due to ESD,

precautions should be taken to avoid exceeding the

rating specified in Table 4.

Latch-Up Avoidance

Unlike conventional CMOS devices, UTSi CMOS

devices are immune to latch-up.

Copyright  Peregrine Semiconductor Corp. 2003

Page 4 of 12

File No. 70/0083~00B | | UTSi  CMOS RFIC SOLUTIONS

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