MPX2010 データシートの表示（PDF） - Freescale Semiconductor

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MPX2010

10 kPa On-Chip Temperature Compensated and Calibrated Silicon Pressure Sensors

Freescale Semiconductor 

Pressure

Operating Characteristics

Table 1. Operating Characteristics (VS = 10 VDC, TA = 25°C unless otherwise noted, P1 > P2)

Characteristic

Symbol

Min

Typ

Max

Units

Pressure Range(1)

Supply Voltage(2)

POP

0

—

10

kPa

VS

—

10

16

VDC

Supply Current

Full Scale Span(3)

Offset(4)

IO

—

6.0

VFSS

24

25

VOFF

–1.0

—

—

mAdc

26

mV

1.0

mV

Sensitivity

ΔV/ΔΡ

—

2.5

—

mV/kPa

Linearity

Pressure Hysteresis (0 to 10 kPa)

—

–1.0

—

1.0

%VFSS

—

—

±0.1

—

%VFSS

Temperature Hysteresis (–40°C to +125°C)

Temperature Coefficient on Full Scale Span

—

TCVFSS

—

–1.0

±0.5

—

—

%VFSS

1.0

%VFSS

Temperature Coefficient on Offset

Input Impedance

Output Impedance

Response Time(5) (10% to 90%)

Warm-Up Time

Offset Stability(6)

TCVOFF

ZIN

ZOUT

tR

—

—

–1.0

1300

1400

—

—

—

—

—

—

1.0

20

± 0.5

1.0

2550

3000

—

—

—

mV

Ω

Ω

ms

ms

%VFSS

1. 1.0 kPa (kiloPascal) equals 0.145 psi.

2. Device is ratiometric within this specified excitation range. Operating the device at a different range may induce additional error due to device

self-heating.

3. Full Scale Span (VFSS) is defined as the algebraic difference between the output voltage at full rated pressure and the output voltage at the

minimum rated pressure.

4. Offset (VOFF) is defined as the output voltage at the minimum rated pressure.

5. Response Time is defined as the time for the incremental change in the output to go from 10% to 90% of its final value when subjected to a

specified step change in pressure.

6. Offset stability is the product's output deviation when subjected to 1000 hours of Pulsed Pressure, Temperature Cycling with Bias Test.

MPX2010

2

Sensors

Freescale Semiconductor

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