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33291 データシートの表示(PDF) - Motorola => Freescale

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33291 Datasheet PDF : 24 Pages
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Freescale Semiconductor, Inc.
Electrical Performance Curves
SCLK
VDD = 5.0 V
33291
Under
Test
SO
CL = 200 pF
CL represents the total capacitance of the test fixture and probe.
Figure 3. Valid Data Delay Time and
Valid Time Test Circuit
VDD = 5.0 V
VPull-Up = 2.5 V
33291
CS
Under
Test
RL = 1.0 k
SO
CL = 20 pF
CL represents the total capacitance of the test fixture and probe.
Figure 4. Enable and Disable Time Test Circuit
SCLK
tr (SI)
< 50 ns
0.7 VDD
50%
tdly(lh)
SO
(Low-to-High)
SO
(High-to-Low)
0.2 VDD
tvalid
0.7 VDD
tr (SO)
tf (SO)
tdly(hl)
tf (SI)
< 50 ns
5.0 V
0.7 VDD
0.2 VDD 0
V0H
V0L
V0H
0.2 VDD
V0L
SO (Low-to-High) is for an output with internal conditions such that the
low-to-high transition of CS causes the SO output to switch from high
to low.
Figure 5. Valid Data Delay Time and
Valid Time Waveforms
CS
0.2 VDD
tr(SI)
< 50 ns
90%
10%
tf(SI)
< 50 ns
0.7 VDD
5.0 V
0
SO
(High-to-Low)
SO
(Low-to-High)
tSO(en)
90%
tSO(en)
10%
tSO(dis)
VTri-State
10%
tSO(dis)
90%
tSO(dis)
V0H
VTri-State
1. SO (high-to-low) waveform is for SO output with internal conditions such that
SO output is low except when an output is disabled as a result of detecting a
circuit fault with CS in a High Logic state, e.g. open load.
2. SO (low-to-high) waveform is for SO output with internal conditions such that
SO output is high except when an output is disabled as a result of detecting a
circuit fault with CS in a High Logic state, e.g. shortened load.
Figure 6. Enable and Disable Time Waveforms
33291
10
For More Information OMnOTTOhRiOsLAPrAoNdALuOcGt,INTEGRATED CIRCUIT DEVICE DATA
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