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MC100EP57(2014) データシートの表示(PDF) - ON Semiconductor

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MC100EP57
(Rev.:2014)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC100EP57 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
MC10EP57, MC100EP57
Table 11. AC CHARACTERISTICS VCC = 0 V; VEE = −3.0 V to −5.5 V or VCC = 3.0 V to 5.5 V; VEE = 0 V (Note 20)
−40°C
25°C
85°C
Symbol
Characteristic
Min Typ Max Min Typ Max Min Typ Max Unit
fmax
tPLH,
tPHL
Maximum Frequency (Figure 2)
>3
>3
>3
GHz
Propagation Delay to
ps
Output Differential
D to Q, Q 250 350 450 275 375 475 320 420 520
COM_SEL, SEL to Q, Q 300 400 500 320 420 520 320 450 575
tSKEW
Device to Device Skew (Note 21)
200
200
200 ps
tJITTER
CLOCK Random Jitter (RMS)
@ v0.5 GHz
@ v1.0 GHz
@ v1.5 GHz
@ v2.0 GHz
@ v2.5 GHz
@ v3.0 GHz
0.122 0.3
0.110 0.3
0.112 0.3
0.128 0.3
0.114 0.3
0.116 0.3
0.140 0.3
0.135 0.3
0.132 0.3
0.139 0.3
0.129 0.3
0.152 0.3
ps
0.172 0.3
0.151 0.3
0.152 0.3
0.163 0.3
0.177 0.3
0.305 1.0
VPP
Input Voltage Swing (Differential Con- 150 800 1200 150 800 1200 150 800 1200 mV
figuration)
tr
Output Rise/Fall Times
tf
(20% − 80%)
Q, Q 70 120 170 70 140 200 70 150 220 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
20. Measured using a 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V.
21. Skew is measured between outputs under identical transitions. Duty cycle skew is defined only for differential operation when the delays
are measured from the cross point of the inputs to the cross point of the outputs.
1000
900
800
700
600
500
400
300
200
100
0
0
1000
2000
FREQUENCY (MHz)
Figure 2. Fmax
3000
4000
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