MC100E457FN データシートの表示（PDF） - ON Semiconductor
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MC100E457FN Datasheet PDF : 9 Pages
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MC10E457, MC100E457
Table 8. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 13)
0°C
25°C
85°C
Symbol
Characteristic
fMAX
Maximum Toggle Frequency
Min Typ Max Min Typ Max Min Typ Max Unit
1.1
1.1
1.1
GH
z
tPLH
Propagation Delay to Output
ps
tPHL
D (Differential) 325 475 700 375 475 650 375 475 650
D (Single−Ended) 275 475 750 325 475 700 325 475 700
SEL 300 500 775 350 500 725 350 500 725
COMSEL 325 525 800 375 525 750 375 525 750
tskew
Within-Device Skew (Note 14)
tskew
Duty Cycle Skew (Note 15) tPLH − tPHL
tJITTER Random Clock Jitter (rms)
VPP
Input Voltage Swing
150
(Differential Configuration)
40
±10
<1.0
40
±10
<1.0
40
ps
±10
ps
<1.0
ps
150
mV
tr/tf
Rise/Fall Time 20−80%
125 275 500
150 275 450 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
13. 10 Series: VEE can vary −0.46 V / +0.06 V.
100 Series: VEE can vary −0.46 V / +0.8 V.
14. Within-device skew is defined as identical transitions on similar paths through a device.
15. Duty cycle skew is defined only for differential operation when the delays are measured from the cross point of the inputs to the cross point
of the outputs.
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