M54HC590D1 データシートの表示（PDF） - STMicroelectronics

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M54HC590D1

RAD-HARD 8 BINARY COUNTER REGISTER WITH 3 STATE OUTPUT

STMicroelectronics 

M54HC590

Test Condition

Symbol

Parameter

VCC CL

(V) (pF)

tREM Minimum Removal 2.0

Time (CCLR)

4.5 50

6.0

Table 7: Capacitive Characteristics

Value

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

28 75

7 15

6 13

95

110

19

22 ns

16

19

Test Condition

Value

Symbol

Parameter

VCC

(V)

CIN Input Capacitance

CPD Power Dissipation

Capacitance (note

1)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

5 10

10

10 pF

40

pF

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC

Figure 6: Test Circuit

tPLH, tPHL

tPZL, tPLZ

tPZH, tPHZ

TEST

CL = 50pF/150pF or equivalent (includes jig and probe capacitance)

R1 = 1KΩ or equivalent

RT = ZOUT of pulse generator (typically 50Ω)

SWITCH

Open

VCC

GND

9/16

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