M54HC32D1 データシートの表示（PDF） - STMicroelectronics

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M54HC32D1

RAD-HARD QUAD 2-INPUT OR GATE

STMicroelectronics 

M54HC32

CAPACITIVE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

VCC

(V)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance 5.0

5 10

10

10 pF

CPD Power Dissipation

Capacitance (note 5.0

21

pF

1)

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate)

TEST CIRCUIT

CL = 50pF or equivalent (includes jig and probe capacitance)

RT = ZOUT of pulse generator (typically 50Ω)

WAVEFORM: PROPAGATION DELAY TIME (f=1MHz; 50% duty cycle)

4/7

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