IDT7025 データシートの表示（PDF） - Integrated Device Technology
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IDT7025 Datasheet PDF : 20 Pages
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IDT7025S/L
HIGH-SPEED 8K x 16 DUAL-PORT STATIC RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER THE
OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(1)(Cont'd.) (VCC = 5.0V ± 10%)
Symbol
Parameter
Test
Condition
Version
7025X35
Typ.(2) Max.
7025X55
7025X70
Mil. Only
Typ.(2) Max. Typ.(2) Max. Unit
ICC Dynamic Operating
Current
(Both Ports Active)
CE = VIL, Outputs Open MIL.
SEM = VIH
S 150 300
L 150 250
f = fMAX(3)
COM’L. S 150 250
L 150 210
150 300 140 300 mA
150 250 140 250
150 250 — —
150 210 — —
ISB1 Standby Current
(Both Ports — TTL
Level Inputs)
ISB2 Standby Current
CEL = CER = VIH
SEMR = SEML = VIH
MIL.
S 13
80
L 13
65
f = fMAX(3)
COM’L. S 13
60
L 13
50
CE"A"=VIL and CE"B"=VIH(5) MIL.
S 85 190
13 80 10 80 mA
13 65 10 65
13 60 — —
13 50 — —
85 190 80 190 mA
(One Port — TTL
Level Inputs)
ISB3 Full Standby Current
(Both Ports — All
Active Port Outputs Open
L 85 160
f = fMAX(3)
COM’L. S 85 155
SEMR = SEML = VIH
L 85 130
Both Ports CEL and
CER > VCC - 0.2V
MIL.
S 1.0 30
L 0.2 10
85 160 80 160
85 155 — —
85 130 — —
1.0 30 1.0 30 mA
0.2 10 0.2 10
CMOS Level Inputs)
ISB4 Full Standby Current
(One Port — All
VIN > VCC - 0.2V or
COM’L. S 1.0 15
VIN < 0.2V, f = 0(4)
L 0.2
5
SEMR = SEML > VCC - 0.2V
CE"A" < 0.2 and
CE"B" > VCC - 0.2V(5)
MIL.
S 80 175
L 80 150
1.0 15 — —
0.2 5
——
80 175 75 175 mA
80 150 75 150
CMOS Level Inputs)
SEMR = SEML > VCC - 0.2V
VIN > VCC - 0.2V or
COM’L. S 80 135
80 135 —
—
VIN < 0.2V,
Active Port Outputs Open,
f = fMAX(3)
L 80 110
80 110 —
—
NOTES:
2683 tbl 10
1. "X" in part numbers indicates power rating (S or L).
2. VCC = 5V, TA = +25°C, and are not production tested.
3. At f = fMAX, address and I/O'S are cycling at the maximum frequency read cycle of 1/tRC, and using “AC Test Conditions” of input levels of GND to 3V.
4. f = 0 means no address or control lines change.
5. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
DATA RETENTION CHARACTERISTICS OVER ALL TEMPERATURE RANGES (L Version Only)
(VLC = 0.2V, VHC = VCC - 0.2V)(4)
Symbol
Parameter
Test Condition
Min.
Typ.(1)
Max. Unit
VDR
VCC for Data Retention
VCC = 2V
2.0
—
—
V
ICCDR
Data Retention Current
CE > VHC
MIL.
tCDR(3)
tR(3)
Chip Deselect to Data Retention Time
Operation Recovery Time
VIN > VHC or < VLC COM’L.
SEM > VHC
NOTES:
1. TA = +25°C, VCC = 2V, and are by characterization but are not production tested.
2. tRC = Read Cycle Time
3. This parameter is guaranteed by device characterization but are not production tested.
4. At Vcc < 2.0V, input leakages are not defined.
—
—
0
tRC(2)
100
4000 µA
100
1500
—
—
ns
—
—
ns
2683 tbl 11
DATA RETENTION WAVEFORM
VCC
4.5V
tCDR
CE
VIH
DATA RETENTION MODE
VDR ≥ 2V
VDR
4.5V
tR
VIH
2683 drw 05
6.16
6
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