HN27C4000G データシートの表示（PDF） - Hitachi -> Renesas Electronics

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HN27C4000G

524288-Word ×8-Bit/262144-Word ×16-Bit CMOS UV Erasable and Programmable ROM

Hitachi -> Renesas Electronics 

HN27C4000G Series

AC Characteristics (VCC = 5 V ± 10%, VPP = VSS to VCC, Ta = 0 to +70°C)

Test Conditions

• Input pulse levels: 0.45 to 2.4 V

• Input rise and fall time: ≤ 10 ns

• Output load: 1 TTL gate +100 pF

• Reference levels for measuring timing: 0.8 V, 2.0 V

HN27C4000

-10

-12

-15

Parameter

Symbol Min Max Min Max Min Max Unit Test Conditions

Address to output delay

t ACC

— 100 — 120 — 150 ns CE = OE = VIL

CE to output delay

t CE

— 100 — 120 — 150 ns OE = VIL

OE to output delay

t OE

— 60 — 60 — 70 ns CE = VIL

Burst address to output delay tBAC

— 50 — 60 — 60 ns CE = VIL

OE high to output float*1

t DF

0

35 0

40 0

50 ns CE = VIL

Address to output hold

t OH

5

—5

—5

— ns CE = OE = VIL

Note: 1. tDF is defined as the time at which the output achieves the open circuit condition and data is no

longer driven.

Read Timing Waveform

Address

CE Standby mode

OE

Data Out

Active mode

tCE

Standby mode

tOE

t ACC

tDF

tOH

Data Out Valid

6

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