CY7C1215F データシートの表示（PDF） - Cypress Semiconductor
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CY7C1215F Datasheet PDF : 16 Pages
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Thermal Resistance[10]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
CY7C1215F
Test Conditions
Test conditions follow standard test methods and pro-
cedures for measuring thermal impedance, per
EIA/JESD51
TQFP
Package
41.83
9.99
Unit
°C/W
°C/W
Capacitance[10]
Parameter
CIN
CCLK
CI/O
Description
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
AC Test Loads and Waveforms
Test Conditions
TA = 25°C, f = 1 MHz,
VDD = 3.3V.
VDDQ = 3.3V
Max. Unit
5 pF
5 pF
5 pF
3.3V I/O Test Load
OUTPUT
Z0 = 50Ω
3.3V
OUTPUT
RL = 50Ω
5 pF
VL = 1.5V
(a)
INCLUDING
JIG AND
SCOPE
R = 317Ω
R = 351Ω
(b)
Note:
10. Tested initially and after any design or process change that may affect these parameters.
VDD
GND
ALL INPUT PULSES
10%
90%
≤ 1 ns
90%
10%
≤ 1 ns
(c)
Document #: 38-05421 Rev. **
Page 9 of 16
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