ATF1508AS-10QL160 データシートの表示（PDF） - Atmel Corporation

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ATF1508AS-10QL160

High performance EE PLD

Atmel Corporation 

BSC

Configuration

Pins and

Macrocells

(Except JTAG

TAP Pins)

BSC

Configuration

for Macrocell

Note: The ATF1508AS has a pull-up option on TMS and TDI pins. This feature is selected as a design

option.

OEJ

0

1

TDO

DQ

0

1

DQ

OUTJ

0

DQ

1

0

1

Pin

DQ

Capture

DR

Update

DR

TDI

Shift

Clock

Mode

Macrocell BSC

Boundary Scan

Definition

Language

(BSDL) Models

for the ATF1508

These are now available in all package types via the Atmel Web Site. These models can be

used for Boundary-scan Test Operation in the ATF1508AS and have been scheduled to con-

form to the IEEE 1149.1 standard.

10 ATF1508AS(L)

0784P–PLD–7/05

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