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TEST CIRCUITS
CROSSTALK TEST CIRCUIT
V+
V-
CC S
SWITCHING TIME TEST CIRCUIT
V+
V-
4211.STTC.E
Vi = 1Vr ms
100kHz
50Ω
COM1
COM2
V+ V-
GND
OUT1 RL = 1KΩ
OUT2
CL = 15pF
VO
CL = 15pF
RL = 1KΩ
CCRR = 20 log [ VO/Vi ]
VS = 3V
Logic Input
100kHz
4.5V
0V
COM1
IN1
V+ V-
OUT1
GND
VO
CL = 35pF
RL = 1KΩ
tr = tf ≤ 20ns
OFF ISOLATION TEST CIRCUIT
V+
V-
Logic Input
VO
50%
90%
50%
10%
Vi = 1Vrms
100kHz
V+
COM1
V- OUT1
50Ω IN1
GND
RL =
1KΩ
VO
CL = 15pF
ton / toff
toff / ton
QIRR = 20 log (VO/Vi)
CHARGE INJECTION TEST CIRCUIT
V+
V-
4211.CITC.EP
COM1
IN1
V+ V-
OUT1
GND
VO
CL = 200pF
4.5V
0.5V
Logic Input
100kHz
Logic Input
VO
∆VO
∆Q = CL∆VO
TOTAL HARMONIC DISTORTION
TEST CIRCUIT
V+
V-
4211.THDTC.EPS.W
Vi = 1Vpp
100kHz
V+ V-
COM1
OUT1
50Ω IN1
GND
RL =
1KΩ
VO
CL = 15pF
ALD4211/ALD4212
Advanced Linear Devices
8
ALD4213