ADXL312(RevB) データシートの表示（PDF） - Analog Devices
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ADXL312 Datasheet PDF : 32 Pages
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ADXL312
Data Sheet
Parameter
POWER SUPPLY
Operating Voltage Range (VS)
Interface Voltage Range (VDD I/O)
Supply Current
Standby Mode Leakage Current
Turn-On (Wake-Up) Time5
TEMPERATURE
Operating Temperature Range
Test Conditions/Comments
Data rate > 100 Hz
Data rate < 10 Hz
T = 25°C
Over entire operating temperature range
Min Typ
2.0
1.7
100 170
30
55
0.1
1.4
−40
Max Unit
3.6
V
VS
V
300 µA
110 µA
2
µA
17
µA
ms
+105 °C
1 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
2 Cross-axis sensitivity is defined as coupling between any two axes.
3 Bandwidth is half the output data rate.
4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the
DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).
5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).
Rev. B | Page 4 of 32
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