JANKCA1N4148 データシートの表示（PDF） - Microsemi Corporation

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JANKCA1N4148

PERFORMANCE SPECIFICATION

Microsemi Corporation 

MIL-PRF-19500/116L

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as specified

herein.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I

herein. Electrical measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table VIb (JANTX and JANTXV) of MIL-PRF-19500 and as specified herein. Electrical

measurements (end-points) shall be in accordance with Table I, group A, subgroup 2 herein except for the thermal

impedance test.

4.4.2.1 Group B inspection, table VIb (JANTX, JANTXV) of MIL-PRF-19500.

Subgroup Method

Conditions

B2

2005

IF = 100 mA, axial tensile stress = 8 lbs, TA = +150GC; (not applicable to UR or UB

package). (This test shall be performed as the first test of subgroup 2).

B3

1027

TA = +30GC H5GC, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1); 1N914: IO = 5 mA,

1N4531: IO = 125 mA, 1N4148-1: IO = 200 mA.

B4

2075

See 4.5.4 herein.

B5

3101

R6JL = 250GC/W, .375 inch (9.52 mm) lead length (non-surface mount).

or 4081

R6JL 100GC/W (UR), R6JC = 150GC/W (UB).

4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in

accordance with Table I, group A, subgroup 2 herein except for the thermal impedance test.

Subgroup Method

Conditions

C2

1056

100 cycles.

C2

2036

Tension: Test condition A, t = 15 seconds, weight = 10 pounds. Lead fatigue:

Test condition E. Terminal strength and lead fatigue not applicable to

UB or UR devices.

C6

1026

TA = +30GC H5GC, VRWM = 75 V(pk), f = 50-60 Hz (see 4.5.1), for:

1N914

IO = 75 mA.

1N4531 IO = 125 mA.

1N4148-1 IO = 200 mA.

4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.

4.5.1 Pulse measurements. Conditions for pulse measurements shall be specified in section 4 of MIL-STD-750.

4.5.2 Life tests. AC tests shall be conducted with a half-sine wave of the peak voltage specified herein impressed

across the diode in the reverse direction, followed by a half-sine waveform of the average rectified current specified

herein. The forward conduction angle of the rectified current shall be not greater than 180 degree nor less than

150 degree.

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