JANKCA1N5551 データシートの表示（PDF） - Unspecified

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JANKCA1N5551

SEMICONDUCTOR DEVICE, DIODE,SILICON, POWER, RECTIFIER

Unspecified 

MIL-PRF-19500/420H

* TABLE III. Delta requirements. 1/ 2/ 3/ 4/ 5/

Step

Inspection

MIL-STD-750

Symbol

Limits

Unit

1. Reverse current

leaking change

Method

Conditions

4016 DC method

2. Forward voltage

change

4011

IF = 1.5 A dc;

pulsed (see 4.5.1)

∆IR1 4/

∆VF1 4/

Min

Max

±100 percent of

initial value or

±250 nA dc,

whichever is

greater.

±50 mV dc

maximum

change from

previous

measured value.

1/ The electrical measurements for table VIa (JANS) of MIL-PRF-19500 are as follows:

a. Subgroup 3, see table III herein, step 2.

b. Subgroup 4, see table III herein, step 2.

c. Subgroup 5, see table III herein, steps 1 and 2.

2/ The electrical measurements for table VIb (JAN, , JANTX and JANTXV) of MIL-PRF-19500 are as follows:

a. Subgroup 3, see table III herein, step 1.

b. Subgroup 6, see table III herein, step 1.

3/ The electrical measurements for table VII of MIL-PRF-19500 are as follows:

a. Subgroup 2, see table III herein, step 1 (JANS).

b. Subgroup 6, see table III herein, step 1 and 2 (JANS), step 1 (JAN, JANTX, JANTXV and).

4/ Devices which exceed the table I limits for this test shall not be accepted.

5/ The electrical measurements for table IX of MIL-PRF-19500 are as follows:

a. Subgroup 2 and 10, see table III herein, step 1 and 2.

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