JANKCA1N5550 データシートの表示（PDF） - Unspecified

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JANKCA1N5550

SEMICONDUCTOR DEVICE, DIODE,SILICON, POWER, RECTIFIER

Unspecified 

MIL-PRF-19500/420H

* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table VIa (JANS) and table VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.

Electrical measurements (end-points) requirements shall be in accordance with the applicable inspections of table I,

subgroup 2 herein. For delta requirements see table III herein.

* 4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500. For B5, if a failure occurs, resubmission shall

be at the test conditions of the original sample.

Subgroup

Method Condition

B3

1056 0°C to +100°C, 25 cycles.

B3

1051 -55°C to +175°C, 100 cycles.

B3

4066 IFSM = rated IFSM (see col. 5 of 1.3); 10 surges of 8.3 ms each at 1 minute

intervals, superimposed on IO = 0, VRWM = 0.

B4

1037 IO = IO2 rated minimum (see col. 4 of 1.3)

VR = rated VRWM (see col. 3 of 1.3 and 4.5.5); 2,000 cycles.

B5

1027 IO = IO2 rated minimum (see col. 4 of 1.3); apply VR = rated VRWM (see col. 3 of 1.3

and 4.5.2) adjust IO to achieve TJ minimum; f = 50-60 Hz.

Option 1: TA = + 30°C max. ; TJ = 225°C minimum; t = 216 hours; n = 45 c = 0.

or

Option 2: TA = + 100°C max. ; TJ = 275°C minimum; t = 96 hours, n = 22,

c = 0.

*

B6

3101

or

4081

RθJL (maximum) ≤ 22°C/W; L = .375 inch (9.53 mm).

For surface mount devices (US version), RθJEC ≤ 11°C/W.

B7

Peak reverse power, see 4.5.5. PRM ≥ 1,000 W. Test shall be performed on

each sublot; sampling plan n = 10, c = 0, electrical end-points, see table I,

subgroup 2 herein.

* 4.4.2.2 Group B inspection, table VIb (JAN, , JANTX and JANTXV of MIL-PRF-19500).

Subgroup

Method Condition

B2

1056 0°C to +100°C, 10 cycles.

*

B2

1051 -55°C to +175°C, 25 cycles.

B3

1027 TJ = 150°C minimum (see 4.5.2.1). Adjust IO to achieve the required TJ; apply

VR = rated VRWM (see col. 3 of 1.3), f = 50-60 Hz (see 4.5.2).

B5

Not applicable .

4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in

accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.

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