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104PHL-ST(2011) データシートの表示(PDF) - Vishay Semiconductors

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104PHL-ST Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
www.vishay.com
Table 4
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
Endurance
IEC 60384-4/
EN130300
subclause 4.13
Tamb = 105 °C; UR applied;
2000 h
Useful life
CECC 30301
subclause 4.13
Shelf life
(storage at
high temperature)
IEC 60384-4/
EN130300
subclause 4.17
Tamb = 105 °C; UR and IR applied;
5000 h
Tamb = 105 °C; no voltage applied;
1000 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
104 PHL-ST
Vishay BCcomponents
REQUIREMENTS
C/C: ± 10 %
ESR 1.3 x spec. limit
Z 2 x spec. limit
IL5 spec. limit
C/C: ± 30 %
ESR 3 x spec. limit
Z 3 x spec. limit
IL5 spec. limit
no short or open circuit,
no visible damage
total failure percentage 3 %
C/C: ± 10 %
ESR 1.2 x spec. limit
IL5 2 x spec. limit
Revision: 03-Nov-11
7
Document Number: 28389
For technical questions, contact: aluminumcaps2@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

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