P4C164L
DATA RETENTION CHARACTERISTICS
Symbol
Parameter
Test Condition
Min
VDR
ICCDR
VCC for Data Retention
Data Retention Current
tCDR
Chip Deselect to
Data Retention Time
tR†
Operation Recovery Time
*TA = +25°C
§tRC = Read Cycle Time
†This parameter is guaranteed but not tested.
2.0
CE
1
≥
VCC
–
0.2V
or
CE2 ≤ 0.2V, VIN ≥ VCC – 0.2V 0
or VIN ≤ 0.2V
tRC§
Typ.*
VCC=
2.0V 3.0V
1
1
Max
VCC=
Unit
2.0V 3.0V
V
3
3
µA
ns
ns
DATA RETENTION WAVEFORM
Document # SRAM116 REV B
Page 7 of 11